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NanoDrop One Spectrophotometer finds and fixes DNA/RNA contamination
This video walks viewers through a workflow of measuring nucleic acid samples, then identifying and correcting DNA/RNA contamination with NanoDrop One UV-Vis spectrophotometers.
1:02
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NIR to the Rescue - Production Efficiency and Cost Savings for Pharma
Near‐infrared (NIR) spectroscopy is a non‐destructive analytical tool with expanding potential in the pharmaceutical value chain. This webinar covers NIR’s capabilities across drug forms, in regulatory compliance, for GMP environments, and more.
47:21
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Challenges in Microplastics Research - from Funding to Library Search - Part I Interview with Dr. Jennifer Lynch, NIST, Hawaii Pacific University
Jennifer Lynch, PhD, NIST, Hawaii Pacific University, shared her perspective on microplastic pollution, its impact on local economies, the funding shortage, and the technical challenges associated with microplastics identification.
39:09
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The Pursuit of an Optimal Method for Microplastics Identification Using FTIR and FTIR Microscope - Part II Interview with Jennifer Lynch, PhD, NIST, Hawaii Pacific University
In Part II of microplastics interview, Jennifer Lynch, PhD, NIST, Hawaii Pacific University, shared her group's research on using FTIR & FTIR microscopy for microplastics and mesoplastics identification, from sample preparation to data reporting.
23:07
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Fixed Method Overview - GENESYS UV-Vis Spectrophotometer
Video shows software screen captures focused on navigating the Fixed method features from GENESYS UV/Vis spectrophotometer.
2:34
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Scan Method Overview - GENESYS UV-Vis Spectrophotometer
Video shows software screen captures focused on navigating the Scan method features from GENESYS UV/Vis Spectrophotometer.
2:54
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Quant method Overview - GENESYS UV-Vis Spectrophotometer
Video shows software screen captures focused on navigating the Quant method features from GENESYS UV/Vis spectrophotometer.
2:29
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Webinar - Benefits of XRD in Teaching and R&D Facilities
This webinar covers applications ranging from thin layer analysis to real-time in-situ phase transitions to Laue crystal orientations. Learn the advantages of such unique XRD solution with the most advanced data processing Rietveld software program.
50:30
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ARL 9900 Simultaneous WDXRF and Integrated XRD System for Complete Elemental and Structural Analysis
Powerful and versatile XRF-XRD instrument to meet the demand for high precision in various industries like steel, copper, aluminium, cement and mining
1:54
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ARL EQUINOX 3000 and 3500 High Resolution Powder X-ray Diffractometer (XRD) for Materials R&D
Research-grade diffraction system for fast and accurate measurements with high resolution detectors, large sample area and choice of X-ray sources.
2:32
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ARL EQUINOX 100 High-Performance Benchtop X-ray Diffractometer for Routine XRD with Convenience
Compact, affordable and transportable benchtop XRD system for QA/QC, academic, and routine applications.
2:17
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ARL OPTIM'X Wavelength-Dispersive X-ray Fluorescence (WDXRF) Spectrometer for Smart & Optimized Elemental Analysis
Compact WDXRF with sequential/simultaneous analysis capabilities for qualitative and quantitative characterization of all types of unknown samples.
2:36
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Thermo Fisher Scientific
United States